Analysis of coupled noise for integrated circuit design

ABSTRACT

A computer-implemented method includes identifying a noise cluster, representing the noise cluster according to a variational model, projecting the variational model onto one or more corners to yield a projected noise cluster, and determining a computed noise for the projected noise cluster. Optionally, the noise cluster includes one or more noise cluster elements, and each of the noise cluster elements are expressed as one or more circuit element terms, according to a canonical form. Optionally, at least one of the corners is a bounding corner. For the bounding corner, the projected noise cluster is generated by maximizing the circuit element terms for those noise cluster elements that tend to increase noise, and by minimizing the circuit element terms for those noise cluster elements that tend to decrease noise, whereby noise is maximized for the canonical form. A corresponding computer program product and computer system are also disclosed.

BACKGROUND

The present invention relates generally to the field of integratedcircuit design, and more particularly to analyzing coupled noise forintegrated circuit design.

Integrated circuit design and fabrication is a lengthy, complex, andcostly process. One challenge that integrated circuit design engineersface is predicting whether a given circuit will suffer an unacceptabledegree of coupled noise under various process corners and operatingconditions. Advances in analysis of coupled noise before fabricationcontinue to enhance the speed and reduce the cost of integrated circuitdesign.

SUMMARY

A computer-implemented method includes identifying a noise cluster,representing the noise cluster according to a variational model,projecting the variational model onto one or more corners to yield aprojected noise cluster, and determining a computed noise for theprojected noise cluster. A corresponding computer program product andcomputer system are also disclosed.

Optionally, the noise cluster includes one or more noise clusterelements, and each of the noise cluster elements are expressed as one ormore circuit element terms, according to a canonical form.

Optionally, at least one of the corners is a bounding corner. For thebounding corner, the projected noise cluster is generated by maximizingthe circuit element terms for those noise cluster elements that tend toincrease noise, and by minimizing the circuit element terms for thosenoise cluster elements that tend to decrease noise, whereby noise ismaximized for the canonical form.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a data flow diagram illustrating a noise analysis program andits associated computer system environment, in accordance with at leastone embodiment of the present invention.

FIG. 2 is a schematic diagram illustrating a noise cluster, inaccordance with at least one embodiment of the present invention.

FIG. 3 is a schematic diagram illustrating various analytical elementsof a noise cluster, in accordance with at least one embodiment of thepresent invention.

FIG. 4 is a flowchart diagram illustrating various operational steps fora noise analysis program, in accordance with at least one embodiment ofthe present invention.

FIG. 5 is a flowchart diagram illustrating various operational steps forgenerating a bounding corner in the context of a noise analysis program,in accordance with at least one embodiment of the present invention.

FIG. 6 is a flowchart diagram illustrating various operational steps forprocessing multiple corners in the context of a noise analysis program,in accordance with at least one embodiment of the present invention.

FIG. 7 is a block diagram displaying various components of a computingapparatus suitable for executing the noise analysis program, inaccordance with at least one embodiment of the present invention.

DETAILED DESCRIPTION

FIG. 1 is a data flow diagram illustrating a noise analysis program 101and its associated computer system environment, generally designated thecomputer system 100, in accordance with at least one embodiment of thepresent invention. Broadly, an abstracted circuit design 102 is dividedinto noise clusters 104. Each noise cluster includes a grouping ofrelated circuit elements that, together, create a source of crosstalk orcapacitively coupled noise. The methods described herein may consider asingle noise cluster 104, and may be understood to reach the entireabstracted circuit design 102 by considering all noise clusters 104,serially or in parallel.

The abstracted circuit design 102 may include a transistor level designand wiring as well as extracted and/or abstracted shapes with calculatedresistances, capacitances, and/or sensitivities. The abstracted circuitdesign 102 may be based on the output of a Simulation Program withIntegrated Circuit Emphasis (SPICE) for one or more variations of theunderlying circuit. Alternatively, the abstracted circuit design 102 mayotherwise be derived from the described circuit as expressed in ahardware description language (HDL) or may be derived from actual datameasured from one or more manufactured prototypes of the circuit towhich the abstracted circuit design 102 is directed.

Broadly, and referring still to FIG. 1, the noise analysis program 101represents the noise cluster 104 according to a variational model 106.In general, the variational model 106 may be understood as any model ofa noise cluster 104 that supports variational analysis of maximum andminimum noise given asserted levels of pessimism which are expressedthrough various assumed and/or nominal values to be passed through themodel by projecting the noise cluster 104 onto one or more processcorners 108 to yield a projected noise cluster 110. The process corner108 includes the assumed and/or nominal values that are of interest tothe projection. The noise analysis program 101 may apply the projectednoise cluster 110 to yield a computed noise 112, which provides ameasure of robustness for the circuit described by the abstractedcircuit design 102. In some embodiments, the process corner 108 isselected to maximize noise to establish a theoretical upper bound, whichcan be used to prove the robustness of the circuit described by theabstracted circuit design 102. Optionally, the noise analysis program101 may add an additional noise margin to the computed noise 112, whichallows users to inject additional pessimism into the analysis asappropriate depending on engineering considerations for the particularrequirements of a given embodiment.

Referring now to FIG. 2, FIG. 2 is a schematic diagram illustrating anexemplary noise cluster 200. In the depicted embodiment, a victimcircuit 201 receives coupled noise from a first aggressor circuit 202and a second aggressor circuit 204 via capacitive couplings 208. Asshown, the victim circuit 201 drives a load 206, which is coupled acrossa load capacitor 207. The first aggressor circuit 202 is a depicted withits driver 203, and the second aggressor circuit 204 is depicted withits driver 205. The capacitive couplings 208 and load capacitor 207 maybe understood to represent effective capacitances between circuitelements arising from the circuit structure, rather than capacitors asexplicit elements of the circuit design 102. In general, the noisecluster 200 may include any combination of victim and aggressor netsincluding all or any subset of the nets' various driver cells,interconnects, and load cells. Accordingly, the capacitive couplings 208may be understood to represent individual effective capacitances atvarious positions in the noise cluster 200. The capacitance of eachcapacitive coupling 208 may be understood as based, for someembodiments, on the local distance between wires 210 and wire thickness212, which may vary according to the process corner 108.

FIG. 3 depicts various analytical elements for an exemplary noisecluster 300. In the depicted embodiment, an aggressor circuit 301, whichcarries a digital signal 302 from its driver 303. Aggressor resistors305 and aggressor capacitors 304 provide an analytical model for theaggressor circuit 301 and its associated interconnects and loads.Similarly, the victim circuit 311 has interconnects and loads modeled byvictim resistors 315 and victim capacitors 314. The source of capacitiveor crosstalk noise between the victim circuit 311 and the aggressorcircuit 301 is modeled by capacitive couplings 309.

Referring still to the schematic diagram of FIG. 3, as represented, theanalytical elements for the noise cluster 300 (referred to herein, andin the Claims as “noise cluster element” or, in the Figures, “NCE”) maybe modeled according a canonical form. Eq. 1 displays a model for anoise cluster element, such as a resistor 315:R=R ₀ +r _(P) ·ΔP+r _(V) ΔV+ . . . +r _(R) ·ΔR  Eq. 1

Eq. 2 displays a model for a capacitive coupling 309:C=C ₀ +c _(P) ·ΔP+c _(V) ·ΔV+ . . . +c _(R) ·ΔR  Eq. 2

Eq. 1 and Eq. 2 both provide a canonical form for the variational model106 of the noise cluster 104, which may be represented analytically asthe noise cluster 300 of FIG. 3. In Eq. 1, R is the expected resistanceof the circuit element expressed as the sum of terms (referred toherein, and in the Claims as “circuit element term”, or, in the Figures“CET”). The first term, R₀ for resistance (Eq. 1) and C₀ for capacitance(Eq. 2) represents the base or nominal value for the noise clusterelement. Each circuit element term may relate to one process variables,for example the on-chip variability sources of Process, Voltage, andTemperature (“PVT”), as well as mask misalignment, wire width, wirethickness, via characteristics, and others. Canonical forms forvariational models may also be prepared for circuit timing in additionto circuit noise. Where such data exists, the canonical form for timingmay be projected in like manner to that disclosed herein such thattiming and noise analysis may be conducted together for the same cornerwith improved analytical value. This leads to a potential advantage insome, but not necessarily all, embodiments of the present inventionwhereby assumptions about the sensitivity values may be avoided in favorof real data.

Each circuit element term may include a sensitivity value (e.g. r_(P),C_(P), r_(V), c_(V), etc.) multiplied by a sigma value (e.g. ΔP, ΔV, ΔR,etc.). The sigma values represent standard deviations from nominal, andmay be understood as measuring pessimism in the manufacturing process,which relates to a high degree of process variability. The sensitivityvalues express the degree of change in the computed measure (resistancefor Eq. 1, capacitance for Eq. 2) based on the variability, and areexpressed in the same units as the first term (e.g. ohms for resistance,farads for capacitance). The sigma value may therefore be understood asscaling the sensitivity with a sigma value of zero meaning nominal suchthat the term drops out. Additionally, a process corner may beunderstood mathematically as including substituting one or more sigmavalues to be paired with corresponding sensitivity values to make upcomplete circuit element terms of the canonical form.

The variational model 106 may be generated based on at least one of aplurality of corner noise abstracts or a plurality of interconnectparasitics. This data provides a basis for analytically determining thesensitivity values that go into the canonical form. Specifically, thevariational model may be generated by any combination of at least onestep selected from the group consisting of: (a) finite differencing; (b)asserting values; and (c) analytically computing. For finitedifferencing, the sensitivities may be computed individually for eachnoise cluster element using multi-corner extraction or characterizationdata with accurate variation aware noise computation for sign-off.Finite differencing for an exemplary resistance at the voltage processvariable (r_(V)) may be calculated as follows:

$\begin{matrix}{r_{V} = {\frac{{R\left( V_{2} \right)} - {R\left( V_{1} \right)}}{V_{2} - V_{1}} = {\frac{\Delta R}{\Delta V}.}}} & {{Eq}.\mspace{14mu} 3}\end{matrix}$

In Eq. 3, V₁ and V₂ may be understood to represent differing processvoltages, with R being the noise cluster element resistance at the givenprocess voltages.

Asserting values for the sensitivities may be done for each type ofnoise cluster element. For example, each metal layer, each type ofdevice or interconnect, etc., may be understood as having similarparasitic resistance and capacitance elements (including victim holdingresistance and pin capacitances), and each may have their ownsensitivities. Setting asserted sensitivities may be computationallyinexpensive as compared with multicorner extraction, as in finitedifferencing; this can make it a convenient method for users to explorethe variability impact in new technologies for which devices may notalready be well-characterized. In asserted sensitivities, sensitivitiesmay be set in terms of fractions of nominal. Asserted sensitivities maybe set for an exemplary resistance as follows:R=R ₀ +a _(P) ·ΔP+ . . . +a _(R) ΔR  Eq. 4

In Eq. 4, the asserted sensitivities a_(P) and a_(R) are inserted intothe canonical form. In addition to the finite difference and assertionof values steps, the sensitivity values may be generated by analyticallycomputing the abstracted circuit design using a circuit solver-typesimulation. This may be done directly, adjointly, or otherwise.

Various embodiments of the present invention provide a means forpreserving generally applicable nondeterministic representations ofnoise through large segments of the noise analysis process untildeterministic values are required to generate a pass/fail conclusion.Thus, canonical forms are transformed into deterministic values byprojection:R=R ₀ +r _(P) ·ΔP+r _(V) ·ΔV+r _(T) ·ΔT+r _(R) ·ΔR→R _(det)  Eq. 5

To compute R_(det) (also for any C_(det)), the noise analysis program101 identifies a process corner 108, which is expressed as a series ofsigma values representing the variability of the particular corner as toeach process variable. Various corners may be selected for differentdegrees of pessimism, depending on the application, the circuit's designrequirements, and what values the user is interested in exploring. Forvarious embodiments, each of the one or more corners is selected fromthe group consisting of: (a) a bounding corner; (b) a non-physicalnon-bounding corner; (c) a nominal corner; and (d) a realistic corner.

The bounding corner may be understood analytically as the worst-case,maximum noise, scenario. This is achieved by ignoring the physicallimitations of actual manufacturing processes, for example by varyingthe process voltage, the process temperature, the local distance betweenwires 210, and the wire thickness 212, etc. for adjacent or nearby noisecluster elements. In practice, process variability tends to affect alladjacent or nearby noise cluster elements in the same way (e.g. all atabove nominal voltage, below nominal temperature, or all with thinwires, or all with closely spaced wires). Thus, the bounding corner maybe understood as a non-physical bounding corner. Generating the boundingcorner is described more fully below and in FIG. 5.

In addition to the bounding corner, partially physical and partiallynon-physical corners provide a means not only to identify individuallysignificant sources of variation, but also to address the shortcoming ofphysical corners, which is that it may be unpredictable whether a givenphysical corner, with its constant or near-constant process variables,may tend to increase or decrease overall noise for a given noise clusteror circuit design. Such corners may be termed “non-physical non-boundingcorners”.

By contrast, a nominal corner is of greatly reduced pessimism whereinall circuit elements are treated the same, with low or zero variabilityin a given process variable. Even where variability is low, the constantor near-constant that is selected may be off from nominal. In betweenvarious nominal corners and the bounding corner are realisticpessimistic corners, which may be constructed to any degree of pessimismthat the user may wish to explore while remaining within realisticboundaries of actual variability in the manufacturing process.

Where a corner, expressed as a sigma value, is selected for each circuitelement term, the projection may be completed to yield a deterministicresistance or capacitance for the noise cluster element using any of avariety of projection operations:a _(P) ·ΔP→−3·a _(P)  Eq. 6a _(P) ·ΔP→±3·|a _(P)|  Eq. 7a _(X) ·ΔX+a _(Y) ·ΔY+a _(Z) ·ΔZ→±3√{square root over (a _(X) ² +a _(Y)² +a _(Z) ²)}  Eq. 8

Eq. 6 describes projection to a specified corner by simple substitution.In the example, ΔP is set equal to−3 and substituted. Eq. 7 describesprojection to the absolute worst corner such that the sigma value isallowed to take ±3 and the absolute value of the sensitivity is used.Finally, in Eq. 8, projecting the variational model onto one or morecorners includes taking a root sum square of two or more of the one orcircuit element terms. The root sum square may provide a more broadlybased projection as compared with projecting a single value. Finally,varying levels of pessimism may be achieved by combining differentprojection operations in the same deterministic calculation:R=R ₀+3·(|a _(T) |+|a _(V)|)+3√{square root over (a _(X) ² +a _(R)²)}−2.5·a _(P)  Eq. 9

Eq. 9 displays an exemplary mixed projection that includes absolutevalue projection, a root sum square projection, and a specified cornerprojection.

FIG. 4 is a flowchart diagram depicting various operational steps for anoise analysis program in accordance with at least one embodiment of thepresent invention. At step 400, the noise analysis program 101identifies a noise cluster 104. At step 402, the noise analysis program101 represents the noise cluster 104 according to the variational model106. At step 404, the noise analysis program 101 projects thevariational model 106 onto one or more corners (e.g. one or more processcorners 108) to yield the projected noise cluster 110. At step 406, thenoise analysis program determines the computed noise based on theprojected noise cluster.

Referring now to FIG. 5, FIG. 5 is a flowchart diagram illustratingvarious operational steps for generating a bounding corner in thecontext of a noise analysis program, in accordance with at least oneembodiment of the present invention. At step 500, similar to step 400,the noise analysis program 101 identifies a noise cluster 104. The noisecluster 104, in the depicted embodiment, is understood to include one ormore noise cluster elements (identified at step 512). At step 510,analogous to step 402, the noise analysis program 101 represents thenoise cluster 104 according to a variational model 106. Representing thenoise cluster 104 according to a variational model includes expressingeach of the one or more noise cluster elements as one or more circuitelement terms (step 514), according to a canonical form, as shown.

Referring still to FIG. 5, in the depicted embodiment, at least one ofthe process corners 108 for analysis includes the bounding corner. Atstep 520, the noise analysis program 101 projects the noise cluster 104onto the bounding corner. The bounding corner may be generated by, foreach noise cluster element (decision block 522), determining whether thenoise cluster element tends to increase or decrease noise in the nosecluster 104. Responsive to the noise cluster element tending to increasenoise (decision block 524), maximizing the one or more circuit elementterms for the noise cluster element (step 528). Responsive to the noisecluster element tending to decrease noise (decision block 526),minimizing the one or more circuit element terms for the noise clusterelement (step 529). In an alternative embodiment, a best-case low noisebounding corner may also be generated. This may be achieved by a similarprocess to that depicted in FIG. 5, but by reversing which circuitelement terms are minimized and maximized so as to decrease overallnoise.

As described in Eq. 1 and Eq. 2, each of the one or more circuit elementterms may include a sensitivity value multiplied by a sigma value. Inthe context of determining a bounding corner, “maximizing” and“minimizing” of circuit element terms means increasing or decreasing,respectively, the sigma value of each term out to a predeterminedmaximum or minimum level of pessimism, expressed in terms of a sigmavalue above or below nominal. The noise analysis program 101 may performthe steps of identifying a predetermined maximum sigma value andidentifying a predetermined minimum sigma value. Maximizing the one ormore circuit element terms for the noise cluster element may includeincreasing the sigma value for the noise cluster element to the maximumsigma value, and minimizing the one or more circuit element terms forthe noise cluster element may include decreasing the sigma value for thenoise cluster element to the minimum sigma value.

For example, users may determine that 3σ or 4σ is sufficientlypessimistic for purposes of determining a noise upper bound for circuitanalysis. The degree to which each value is “maximized” or “minimized”may vary based on the specific embodiment and engineeringconsiderations, such that the invention is expressly understood toencompass “maximizing” or “minimizing” to a lesser degree than possiblein theory, but rather out to a variable extreme notion of variation thatis understood, in the particular embodiment, to be sufficient formeaningfully establishing the most noise possible for a valuablenon-physical bounding corner.

Referring still to FIG. 5, at step 530 (analogous to step 406), thenoise analysis program 101 determines the computed noise 112 based onthe projected noise cluster 110, which is, partly or wholly, for thebounding corner. Because a theoretical, worse-than-realistic level ofnoise has been created through the bounding corner, the noise analysisprogram 101 may conclude, at step 540, that noise is maximized for thecanonical form. Further, in embodiments where the one or more processcorners 108 include only the bounding corner, the computed noise 112includes a noise upper bound by virtue of the worse-than-realisticassumptions of the bounding corner.

FIG. 6 is a flowchart diagram illustrating various operational steps forprocessing multiple corners by the noise analysis program 101. At step600, the noise analysis program identifies, for each noise clusterelement one or more process variables. Examples of process variablesinclude PVT: Process, Voltage, and Temperature. In the context of PVT,Process may include the distance between wires 210 and wire thickness212. Additional process variables may include relative speed ofN-channel and P-channel devices (NFETs and PFETs, respectively, forMOSFET devices) in the manufactured circuit. Thus, each of the one ormore process variables is associated with at least one of the one ormore corners to be analyzed, which may include any combination ofbounding corners, nominal corners, or realistic pessimistic corners.

At step 602, for each of the one or more process variables, the noiseanalysis program 101 identifies a process variable sensitivity value.Where a canonical form is used, as in Eq. 1 and Eq. 2, the processvariable sensitivity value (e.g. r_(P)) may be the sensitivity factor ofthe circuit element term for the particular process variable and noisecluster element in combination. At step 604, the noise analysis program101 divides the one or more process variables into a plurality ofsignificant process variables and a plurality of insignificant processvariables, based on the process variable sensitivity value.Specifically, high sensitivity process variables will affect noise muchmore for a given change in the underlying variable than willinsignificant process variables. In various embodiments, more than twogroupings or gradations of sensitivity may be applied, and the boundarybetween the groupings may vary depending on engineering considerationsand the degree of pessimism sought by the user.

Based on the distinction between significant and insignificant processvariables, projecting the variational model onto the one or more corners(analogous to step 404) may include, at step 606, for each of theplurality of significant process variables, projecting each of the oneor more circuit element terms onto at least one of a nominal corner, anon-physical non-bounding corner, or a realistic corner, and, at step608, for each insignificant process variable, projecting each of the oneor more circuit element terms onto the bounding corner. Since manycorners will thus include overlapping computed values for those circuitelement terms projected to the bounding corner, it is possible to obtainadditional computational efficiency by projecting once to the boundingcorner on all of the insignificant process variables, and then changingonly the additional corners during iterative processing. Thus, byselecting the bounding corner for the insignificant process variables,those process variables are analyzed as worst-case, and can bediscounted as sources of unacceptable noise, if the computed noise 112for the noise cluster 104 or overall circuit remains at acceptablelevels. An additional potential benefit for those embodiments thatrestrict insignificant process variables to being projected to a singlebounding corner is that it reduces the number of unique corners thatmust be enumerated in order to cover the variational space. By contrast,by selecting nominal or realistic pessimistic corners for thesignificant process variables, users can explore and fine-tune varyinglevels of pessimism in those circuit elements that matter the most fornoise.

In embodiments configured for further multi-corner analysis, the noiseanalysis program 101 may identify a noise threshold and determinewhether the computed noise 112 exceeds the noise threshold. Responsiveto the computed noise 112 exceeding the noise threshold, the noiseanalysis program 101 may return a noise violation. The noise thresholdmay be modeled as a noise rejection curve. Where a noise pulse ismodeled as a plot of voltage against time, it is possible to analyze thepeak and width of noise pulses and, then plot a curve of maximallyacceptable noise peak versus noise width such that a tall (relativelyhigh voltage) pulse might be acceptable noise if it is sufficientlynarrow (short in duration), or a wide (long in duration) pulse may beacceptable noise if it is short (relatively low voltage). Exactquantities for acceptable and unacceptable noise are dependent upon thecircuit design requirements and engineering considerations. Moregenerally, noise thresholds, whether modeled as a noise rejection curveor otherwise, may be understood as one set of criteria among many forthe circuit's passing or failing noise analysis of the presentinvention. Additionally, the noise rejection curve may be applied toenrich the circuit model (e.g. FIG. 2) by replacing the load 206 orother sink; thus a deterministic pass/fail output may be applied to thevariational model for various embodiments of the present invention.Further, by modeling the load 206 in accordance with the canonical formsof the present invention, the noise rejection curve may be projected toany desired corner, thus generating deterministic failure criteria forthe corner.

Thus, the multi-corner analysis may be repeated over many corners 108and combinations of corners 108, as well as over many noise clusters104. Using a noise violation as output, the noise analysis program 101may be used to identify noise sources at all levels throughout theanalysis. Thus, projecting the variational model onto the one or morecorners (step 404) may further include iteratively processing a nextcorner of the one or more corners. In such a process, the next corner isof the at least one of the nominal corner, the non-physical non-boundingcorner, or the realistic corner. Thus, in various embodiments, thebounding corner is processed first, followed by all other corners. Invarious embodiments, the bounding corner may be immediately followed bya nominal corner, and then all other corners. Alternatively, the orderof processing the other corners chosen may be in order of decreasingpessimism. Alternatively, the order of processing the other corners maybe tailored by the user to provide the most filtering and/or learningoffered to the user. Under various multi-corner analysis approaches, thenoise analysis program 101 may be understood as beginning with a worstcase scenario (the bounding corner or most pessimistic non-boundingcorner) and proceeding to adjust noise-causing variability until aperforming circuit or an informatively non-performing circuit is found.This provides the user with detailed diagnostic information about thenoise tolerance of the manufacturing process for the circuit design 102.

In a variation on the multi-corner analysis, the noise analysis program101 may speed up the projection of any given corner. Specifically,projecting the variational model onto one or more corners may beunderstood to include projecting the variational model onto a fastcorner. The fast corner includes one or more initial sigma values. Theinitial sigma values are simply those sigma values included in theparticular corner to be sped up by creating the fast corner. To generatea fast corner, the noise analysis program 101 divides the one or morenoise cluster elements into a plurality of significant noise clusterelements and a plurality of insignificant noise cluster terms, based ona nominal value for each noise cluster element. The nominal value for agiven noise cluster element may be understood, in some embodiments, asthe single sigma value that would be applied to all circuit elementterms for the noise cluster in a nominal corner. Those noise clusterelements that have a small nominal value relative to other noise clusterelements may be identified as insignificant, and those noise clusterelements that have a large nominal value relative to other noise clusterelements may be identified as significant. The cutoff betweensignificant and insignificant may be determined by the user according todesign-specific or project-specific considerations. For each of theplurality of insignificant noise cluster elements, the noise analysisprogram 101 may set at least one corresponding sigma value of the one ormore initial sigma values to a bounding sigma value. The bounding sigmavalue may be understood as the worst-case value that would be appliedfor the bounding corner, as described above. For each of the pluralityof significant noise cluster elements, the noise analysis program 101leaves at least one corresponding sigma value of the one or more initialsigma values unchanged. The resulting fast corner is faster to processthan it would otherwise be because it is not necessary to calculateand/or re-project individual sigma values for all circuit element terms,especially if the sigma values and/or projections for the boundingcorner have already been determined such that they may be re-used.

FIG. 7 is a block diagram depicting components of a computer 700suitable for executing the noise analysis program 101. FIG. 7 displaysthe computer 700, the one or more processor(s) 704 (including one ormore computer processors), the communications fabric 702, the memory706, the RAM, the cache 716, the persistent storage 708, thecommunications unit 710, the I/O interfaces 712, the display 720, andthe external devices 718. It should be appreciated that FIG. 7 providesonly an illustration of one embodiment and does not imply anylimitations with regard to the environments in which differentembodiments may be implemented. Many modifications to the depictedenvironment may be made.

As depicted, the computer 700 operates over a communications fabric 702,which provides communications between the cache 716, the computerprocessor(s) 704, the memory 706, the persistent storage 708, thecommunications unit 710, and the input/output (I/O) interface(s) 712.The communications fabric 702 may be implemented with any architecturesuitable for passing data and/or control information between theprocessors 704 (e.g. microprocessors, communications processors, andnetwork processors, etc.), the memory 706, the external devices 718, andany other hardware components within a system. For example, thecommunications fabric 702 may be implemented with one or more buses or acrossbar switch.

The memory 706 and persistent storage 708 are computer readable storagemedia. In the depicted embodiment, the memory 706 includes a randomaccess memory (RAM). In general, the memory 706 may include any suitablevolatile or non-volatile implementations of one or more computerreadable storage media. The cache 716 is a fast memory that enhances theperformance of computer processor(s) 704 by holding recently accesseddata, and data near accessed data, from memory 706.

Program instructions for the noise analysis program 101 may be stored inthe persistent storage 708 or in memory 706, or more generally, anycomputer readable storage media, for execution by one or more of therespective computer processors 704 via the cache 716. The persistentstorage 708 may include a magnetic hard disk drive. Alternatively, or inaddition to a magnetic hard disk drive, the persistent storage 708 mayinclude, a solid state hard disk drive, a semiconductor storage device,read-only memory (ROM), electronically erasable programmable read-onlymemory (EEPROM), flash memory, or any other computer readable storagemedia that is capable of storing program instructions or digitalinformation.

The media used by the persistent storage 708 may also be removable. Forexample, a removable hard drive may be used for persistent storage 708.Other examples include optical and magnetic disks, thumb drives, andsmart cards that are inserted into a drive for transfer onto anothercomputer readable storage medium that is also part of the persistentstorage 708.

The communications unit 710, in these examples, provides forcommunications with other data processing systems or devices. In theseexamples, the communications unit 710 may include one or more networkinterface cards. The communications unit 710 may provide communicationsthrough the use of either or both physical and wireless communicationslinks. The noise analysis program 101 may be downloaded to thepersistent storage 708 through the communications unit 710. In thecontext of some embodiments of the present invention, the source of thevarious input data may be physically remote to the computer 700 suchthat the input data may be received and the output similarly transmittedvia the communications unit 710.

The I/O interface(s) 712 allows for input and output of data with otherdevices that may operate in conjunction with the computer 700. Forexample, the I/O interface 712 may provide a connection to the externaldevices 718, which may include a keyboard, keypad, a touch screen,and/or some other suitable input devices. External devices 718 may alsoinclude portable computer readable storage media, for example, thumbdrives, portable optical or magnetic disks, and memory cards. Softwareand data used to practice embodiments of the present invention may bestored on such portable computer readable storage media and may beloaded onto the persistent storage 708 via the I/O interface(s) 712. TheI/O interface(s) 712 may similarly connect to a display 720. The display720 provides a mechanism to display data to a user and may be, forexample, a computer monitor.

The programs described herein are identified based upon the applicationfor which they are implemented in a specific embodiment of theinvention. However, it should be appreciated that any particular programnomenclature herein is used merely for convenience, and thus theinvention should not be limited to use solely in any specificapplication identified and/or implied by such nomenclature.

The present invention may be a system, a method, and/or a computerprogram product at any possible technical detail level of integration.The computer program product may include a computer readable storagemedium (or media) having computer readable program instructions thereonfor causing a processor to carry out aspects of the present invention.

The computer readable storage medium can be a tangible device that canretain and store instructions for use by an instruction executiondevice. The computer readable storage medium may be, for example, but isnot limited to, an electronic storage device, a magnetic storage device,an optical storage device, an electromagnetic storage device, asemiconductor storage device, or any suitable combination of theforegoing. A non-exhaustive list of more specific examples of thecomputer readable storage medium includes the following: a portablecomputer diskette, a hard disk, a random access memory (RAM), aread-only memory (ROM), an erasable programmable read-only memory (EPROMor Flash memory), a static random access memory (SRAM), a portablecompact disc read-only memory (CD-ROM), a digital versatile disk (DVD),a memory stick, a floppy disk, a mechanically encoded device such aspunch-cards or raised structures in a groove having instructionsrecorded thereon, and any suitable combination of the foregoing. Acomputer readable storage medium, as used herein, is not to be construedas being transitory signals per se, such as radio waves or other freelypropagating electromagnetic waves, electromagnetic waves propagatingthrough a waveguide or other transmission media (e.g., light pulsespassing through a fiber-optic cable), or electrical signals transmittedthrough a wire.

Computer readable program instructions described herein can bedownloaded to respective computing/processing devices from a computerreadable storage medium or to an external computer or external storagedevice via a network, for example, the Internet, a local area network, awide area network and/or a wireless network. The network may comprisecopper transmission cables, optical transmission fibers, wirelesstransmission, routers, firewalls, switches, gateway computers and/oredge servers. A network adapter card or network interface in eachcomputing/processing device receives computer readable programinstructions from the network and forwards the computer readable programinstructions for storage in a computer readable storage medium withinthe respective computing/processing device.

Computer readable program instructions for carrying out operations ofthe present invention may be assembler instructions,instruction-set-architecture (ISA) instructions, machine instructions,machine dependent instructions, microcode, firmware instructions,state-setting data, configuration data for integrated circuitry, oreither source code or object code written in any combination of one ormore programming languages, including an object oriented programminglanguage such as Smalltalk, C++, or the like, and procedural programminglanguages, such as the “C” programming language or similar programminglanguages. The computer readable program instructions may executeentirely on the user's computer, partly on the user's computer, as astand-alone software package, partly on the user's computer and partlyon a remote computer or entirely on the remote computer or server. Inthe latter scenario, the remote computer may be connected to the user'scomputer through any type of network, including a local area network(LAN) or a wide area network (WAN), or the connection may be made to anexternal computer (for example, through the Internet using an InternetService Provider). In some embodiments, electronic circuitry including,for example, programmable logic circuitry, field-programmable gatearrays (FPGA), or programmable logic arrays (PLA) may execute thecomputer readable program instructions by utilizing state information ofthe computer readable program instructions to personalize the electroniccircuitry, in order to perform aspects of the present invention.

Aspects of the present invention are described herein with reference toflowchart illustrations and/or block diagrams of methods, apparatus(systems), and computer program products according to embodiments of theinvention. It will be understood that each block of the flowchartillustrations and/or block diagrams, and combinations of blocks in theflowchart illustrations and/or block diagrams, can be implemented bycomputer readable program instructions.

These computer readable program instructions may be provided to aprocessor of a general purpose computer, special purpose computer, orother programmable data processing apparatus to produce a machine, suchthat the instructions, which execute via the processor of the computeror other programmable data processing apparatus, create means forimplementing the functions/acts specified in the flowchart and/or blockdiagram block or blocks. These computer readable program instructionsmay also be stored in a computer readable storage medium that can directa computer, a programmable data processing apparatus, and/or otherdevices to function in a particular manner, such that the computerreadable storage medium having instructions stored therein comprises anarticle of manufacture including instructions which implement aspects ofthe function/act specified in the flowchart and/or block diagram blockor blocks.

The computer readable program instructions may also be loaded onto acomputer, other programmable data processing apparatus, or other deviceto cause a series of operational steps to be performed on the computer,other programmable apparatus or other device to produce a computerimplemented process, such that the instructions which execute on thecomputer, other programmable apparatus, or other device implement thefunctions/acts specified in the flowchart and/or block diagram block orblocks.

The flowchart and block diagrams in the Figures illustrate thearchitecture, functionality, and operation of possible implementationsof systems, methods, and computer program products according to variousembodiments of the present invention. In this regard, each block in theflowchart or block diagrams may represent a module, segment, or portionof instructions, which comprises one or more executable instructions forimplementing the specified logical function(s). In some alternativeimplementations, the functions noted in the blocks may occur out of theorder noted in the Figures. For example, two blocks shown in successionmay, in fact, be executed substantially concurrently, or the blocks maysometimes be executed in the reverse order, depending upon thefunctionality involved. It will also be noted that each block of theblock diagrams and/or flowchart illustration, and combinations of blocksin the block diagrams and/or flowchart illustration, can be implementedby special purpose hardware-based systems that perform the specifiedfunctions or acts or carry out combinations of special purpose hardwareand computer instructions.

What is claimed is:
 1. A system comprising: an abstracted circuitdesign; a noise cluster; a noise analysis program configured to identifythe noise cluster; represent the noise cluster according to avariational model wherein the variational model supports variationalanalysis of a maximum and a minimum noise given asserted levels ofpessimism, the maximum and the minimum noise are expressed throughassumed and/or nominal values that are passed through the variationalmodel to represent the noise cluster; project the variational model ontoone or more corners to yield a projected noise cluster; and determine acomputed noise for the projected noise cluster.
 2. The system of claim1, wherein the variational model is generated, based on at least one ofa plurality of corner noise abstracts or a plurality of interconnectparasitics, by any combination of at least one step selected from thegroup consisting of: (a) finite differencing; (b) asserting values; and(c) analytically computing.
 3. The system of claim 1, wherein: the noisecluster comprises one or more noise cluster elements; and representingthe noise cluster according to a variational model comprises expressingeach of the one or more noise cluster elements as one or more circuitelement terms, according to a canonical form.
 4. The system of claim 3,wherein each of the one or more circuit element terms comprises asensitivity value multiplied by a sigma value.
 5. The system of claim 3,wherein projecting the variational model onto one or more cornerscomprises taking a root sum square of two or more of the one or morecircuit element terms.
 6. The system of claim 3, further comprisingadding an additional noise margin to the computed noise.
 7. The systemof claim 3 wherein the noise analysis program is further configured to:project the variational model onto one or more corners by projecting thevariational model onto a fast corner; wherein the fast corner comprisesone or more initial sigma values.
 8. The system of claim 7 wherein thenoise analysis program is further configured to: transform the one ormore initial sigma values by: dividing the one or noise cluster elementsinto a plurality of significant noise cluster elements and a pluralityof insignificant noise cluster elements, based on a nominal value foreach noise cluster element; for each of the plurality of insignificantnoise cluster elements, setting at least one corresponding sigma valueof the one or more initial sigma values to a bounding sigma value; andfor each of the plurality of significant noise cluster elements, leavingat least one corresponding sigma value of the one or more initial sigmavalues unchanged.
 9. The system of claim 3, wherein each of the one ormore corners is selected from the group consisting of: (a) a boundingcorner; (b) a non-physical non-bounding corner; (c) a nominal corner;and (d) a realistic corner.
 10. The system of claim 9, wherein: at leastone of the one or more corners comprises the bounding corner; and thebounding corner is generated by, for each noise cluster element:responsive to the noise cluster element tending to increase noise,maximizing the one or more circuit element terms for the noise clusterelement; and responsive to the noise cluster element tending to decreasenoise, minimizing the one or more circuit element terms for the noisecluster element; whereby noise is maximized for the canonical form forthe bounding corner.
 11. The system of claim 10, wherein: the one ormore corners comprises only the bounding corner; and the computed noisecomprises a noise upper bound.
 12. The system of claim 10, wherein thenoise analysis program is further configured to: identify apredetermined maximum sigma value; identify a predetermined minimumsigma value; maximize the one or more circuit element terms for thenoise cluster element by increasing the sigma value for the noisecluster element to the maximum sigma value; and minimize the one or morecircuit element terms for the noise cluster element by decreasing thesigma value for the noise cluster element to the minimum sigma value;and wherein each of the one or more circuit element terms comprises asensitivity value multiplied by a sigma value.
 13. The system of claim9, wherein the noise analysis program is further configured to: for eachthe noise cluster element, identify one or more process variables, eachof the one or more process variables being associated with at least oneof the one or more corners; and for each of the one or more processvariables, identify a process variable sensitivity value; and dividingthe one or more process variables into a plurality of significantprocess variables and a plurality of insignificant process variables,based on the process variable sensitivity value.
 14. The system of claim13 wherein the noise analysis program is further configured to: projectthe variational model onto one or more corners by: for each of theplurality of significant process variables, projecting each of the oneor more circuit element terms onto at least one of the nominal corner,the non-physical non-bounding corner, or the realistic corner; and foreach of the plurality of insignificant process variables, projectingeach of the one or more circuit element terms onto the bounding corner.15. The system of claim 14 wherein the noise analysis program is furtherconfigured to: identify a noise threshold; determine whether thecomputed noise exceeds the noise threshold; and return a noiseviolation, in response to the computed noise exceeding the noisethreshold.
 16. The system of claim 15 wherein the noise analysis programis further configured to: project the variational model onto one or morecorners by iteratively processing a next corner of the one or morecorners; and wherein the next corner is of the at least one of thenominal corner, the non-physical non-bounding corner, or the realisticcorner.
 17. A computer program product, the computer program productcomprising one or more computer readable storage media and programinstructions stored on the one or more computer readable storage media,the program instructions comprising instructions to: identify a noisecluster; represent the noise cluster according to a variational modelwherein the variational model supports variational analysis of a maximumand a minimum noise given asserted levels of pessimism, the maximum andthe minimum noise are expressed through assumed and/or nominal valuesthat are passed through the variational model to represent the noisecluster; project the variational model onto one or more corners to yielda projected noise cluster; and determine a computed noise for theprojected noise cluster.
 18. The computer program product of claim 17,wherein: the noise cluster comprises one or more noise cluster elements;and the instructions to represent the noise cluster according to avariational model comprise instructions to express each of the one ormore noise cluster elements as one or more circuit element terms,according to a canonical form.
 19. The computer program product of claim18, wherein: at least one of the one or more corners comprises abounding corner; and the bounding corner is generated by, for each noisecluster element: responsive to the noise cluster element tending toincrease noise, maximizing the one or more circuit element terms for thenoise cluster element; and responsive to the noise cluster elementtending to decrease noise, minimizing the one or more circuit elementterms for the noise cluster element; whereby noise is maximized for thecanonical form for the bounding corner.